Specifications
Substrate Materials
CX Thin Films offers the following substrate materials. For more details on the types of products available, please download our catalog or contact sales.
| Material | Size | Standard Thickness(1) | Surface Finish | Dielectric Constant (At 1 MHz) |
Coefficient of Thermal Expansion (× 10-6 / °C) |
|---|---|---|---|---|---|
|
Silicon (Si) (With 12 kÅ SiO2) |
3 in Diameter | 0.010 in | Chemical Polish | N/A (SiO2 1.38) |
2.49 – 4.44 (25°C to < 1000°C) |
|
Alumina (Al2O3) |
To 4 in square | 0.010 in | 2 μin – 3 μin | 9.9 |
7 (25°C to 300°C) |
|
Polished Alumina (Al2O3) |
To 4 in square | 0.010 in | To < 2 μin | 9.9 |
7 (25°C to 300°C) |
|
Quartz (Fused Silica) |
3 in diameter | 0.010 in | 60 / 40 Optical Polish |
3.826 |
0.55 (25°C to 320°C) |
|
Berylium Oxide (BeO) |
2.25 in square | 0.010 in | < 5 μin | 6.76 |
9 (25°C to < 1000°C) |
|
Aluminum Nitride (AlN) |
2.25 in square | 0.010 in | 6 μin – 8 μin | 8.0 – 9.1 |
4.6 – 5.7 (25°C to < 1000°C) |
Standard dimensional tolerance for length and width is ± 0.002 in. The thickness tolerance is ± 0.001 in.
(1) Standard thickness on chip size of 12 × 9 is 0.005 in.
Testing Specifications
All CX Thin Films products meet or exceed MIL-PRF-55342 testing and standards. The table below shows the appropriate specification for each type of testing.
| Testing Performed | Specification / Standard |
|---|---|
| Visual Inspection | MIL-PRF-55342 MIL-STD-883 |
| Mechanical Inspection | MIL-PRF-55342 |
| DC Resistance | MIL-PRF-55342 MIL-STD-202 |
| Resistance Temperature Characteristics (TCR) | MIL-PRF-55342 MIL-STD-202 |
| Short Time Overload | MIL-PRF-55342 |
| High Temperature Exposure | MIL-PRF-55342 |
| Thermal Shock | MIL-PRF-55342 MIL-STD-202 |
| Resistance to Bonding Exposure | MIL-PRF-55342 |
| Wire Bonding Integrity | MIL-PRF-55342 |
| Life Test | MIL-PRF-55342 MIL-STD-202 |